Instrumentation: Scanning Electron Microscope (SEM) In order to examine the surface topography of different pieces of evidence, forensic investigators can employ the powerful Scanning Electron Microscope (SEM). High-resolution imaging with a large depth of focus is possible with SEM, which makes it appropriate for inspecting objects such as nails, cables, cartridge cases, and bullets. Using electrons instead of light, SEM can reveal minute surface details that are invisible to optical microscopy, in contrast to standard microscopes. To provide vital evidence for matching and identification, SEM is used in criminalistics to examine striations on bullets, marks on cartridge cases, and impressions on wires or fingernails. 

Case Example: Analysis of Cartridge Cases Cartridge cases discovered at a crime scene were once examined using SEM. Forensic specialists were able to correlate the firing pin and extractor marks on the recovered cartridges with those from a suspect's firearm because to the extreme magnification and detailed imaging capabilities of the device. The suspect's conviction resulted from the SEM's ability to clearly identify the link between the pistol and the crime, thanks to the detailed surface impressions that were evident. The utilization of SEM in this inquiry yielded definitive proof, augmenting the precision of the forensic examination and bolstering the case's resolution.